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Spectrometer Product Comparison | Buying Guide for Four Series

Which Spectrometer Is Right For You?

Four core series to meet different application needs

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Entry Level

Y Series

📱
Phone Direct Connection
💰
Ultimate Cost Performance
📲
View via Mobile App
📄
Export as PDF via PC
🔬
340-1000nm
🎯
7nm
No complex analysis needed, just want to intuitively experience the charm of spectra
View Y Series
Home/Education Use
Sensor Level

H Series

📡
Micro Sensor
🔌
Fpc 12pin for embedded device
📊
Customized the data formats
🔬
340-1050nm
🎯
2nm、5.5nm
Designed for integration, smallest size, ideal for embedding into your devices
View H Series
For Secondary - Development Use
Professional Level

P Series / B Series

📶
Bluetooth Wireless
📈
<5nm Resolution
📤
Data Can Be Exported
📲
Bluetooth Wireless (P4 & B4 only)
🎨
Photometric Parameters
🌱
Plant Growth Parameters
Professional measurement of photometric Parameters/horticultural lighting
View P Series / B Series
Daily/Production Use
Development Level
T Series
💻
PC Development
🎯
2nm、5nm
🖥️
Windows PC and Android
🔦
70°,Fiber Interface
📈
Relative Spectral Data
🔬
340-1020nm、 350-1070nm
Laboratory-grade accuracy, complete data analysis solution
View T Series
Scientifc/Research Use

Core Feature Comparison

Feature H Series Y Series P Series T Series
Secondary Development Support ✓ Supported ✗ Not Supported ✓ Supported ✓ Supported
Data Export ✓ CSV/Raw Data △ Limited ✓ CSV/Charts ✓ Spectrum Only
Wireless Connection ✗ For embedded device △ Uart/ttl cable ✓ P4 Supports Bluetooth △ Uart/ttl cable
Application Scenario Secondary Development/
System Integration
Education /Home Professional measurement
of photometric Parameters
/horticultural lighting
Research
/System Development
Typical Application Device Integration Education/Hobby Professional Measurement Research/
System Development
产品应用 - SpectralTech
Product Applications
  • 01
    Photometry & Color Measurement
    Photometry & Color Measurement
    Small spectrometers as core sensors for spectrophotometers or colorimeters can be used for real-time detection in road/tunnel lighting, indoor lighting, commercial lighting, venue lighting, OLED lighting, plant factories, etc. They can also be applied in R&D, quality inspection, and production line monitoring. Based on spectral measurement principles, related products can perform more in-depth spectral analysis of lighting product color rendering and mesopic/scotopic photometric quantities. This has stronger applicability in the present and future, where color quality and mesopic vision are increasingly important.
  • Raman Spectroscopy & Material Identification
    Our compact spectrometers support Raman spectroscopy for material identification and characterization. By capturing molecular vibrational signatures, they provide spectral fingerprints that help distinguish materials and reveal differences in chemical composition and structure. Integrated with suitable lasers, optical probes, and analysis software, our spectrometers enable customers to develop tailored solutions for materials research, incoming material inspection, and industrial quality control.
    02
    Raman Spectroscopy & Material Identification
  • 03
    Plant & Agricultural Spectroscopy
    Plant & Agricultural Spectroscopy
    Our spectral sensing solutions provide data and derived indicators for plant phenotyping, chlorophyll assessment, water-status analysis, and vegetation monitoring, including the Normalized Difference Vegetation Index (NDVI). These insights help customers evaluate plant growth and physiological changes. By combining our spectral data with their own calibration models, algorithms, and software, customers can develop specialized applications for crop research, precision agriculture, and agricultural monitoring.
  • Semiconductor Epitaxial Layer Measurement
    Our compact spectrometers support white-light interferometry for measuring semiconductor epitaxial layers with thicknesses from 50 to 1,000 nm. By analyzing spectral interference produced by reflections at layer interfaces, together with appropriate optical models, customers can determine layer thickness without contacting the wafer surface. This capability supports the development of measurement systems for epitaxial growth evaluation, process optimization, and semiconductor quality control.
    04
    Semiconductor Epitaxial Layer Measurement
SEE Our Strengths

Simple & Accurate

Simple UART Control
Achieve professional-grade spectral measurements with simple UART commands.

产品优势
  • Compact Size Unlike traditional bulky optical spectrometers
  • Simple UART Control Achieve professional-grade spectral measurements with simple UART commands.
  • Low Cost Say goodbye to $5000+ price tags!

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